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KMITL
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The current gain of bipolar transistor in the IGBT measurement
The current gain of bipolar transistor in the IGBT measurement
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Date
2002-11-07
Authors
J. Parnklang
S. Niemcharoen
S. Yardsamer
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Abstract
Description
Keywords
Insulated-gate bipolar transistor
,
Heterostructure-emitter bipolar transistor
,
Current injection technique
,
Bipolar transistor biasing
,
Heterojunction bipolar transistor
Citation
URI
https://dspace.kmitl.ac.th/handle/123456789/281
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