Minority Carrier Lifetime Controlling of Mesa Diodes by Electron Beam Irradiation

Thumbnail Image

Date

2013-09-01

Authors

Journal Title

Journal ISSN

Volume Title

Publisher

Abstract

Description

Keywords

Saturation current, Reverse leakage current, Leakage (economics), Electron beam processing, Saturation (graph theory), Carrier lifetime, Mesa

Citation

URI

https://dspace.kmitl.ac.th/handle/123456789/4166

Collections

All

Endorsement

Review

Supplemented By

Referenced By