Sukkha, Usa

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Synchrotron-based NEXAFS analysis of thermal-treated diamond-like carbon films
(2020-10-01)
Chunjaemsri, Thanun
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Chanlek, Narong
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Sukkha, Usa
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Nakajima, Hideki
;
Rujirawat, Saroj
Diamond-like carbon (DLC) film properties are known to vary with important factors such as the ratio of sp3 to sp2 hybridization, film thickness, and contaminations. In this work, the carbon bonding contents in DLC thin films, thermal-treated with various temperatures between room temperature to 250 °C, were studies by near-edge X-ray absorption fine structure (NEXAFS), X-ray photoelectron spectroscopy (XPS), and Raman spectroscopy. From NEXAFS measurements, the sp3/sp2 ratios of DLC films were found to be unaffected by the thermal treatments. The results indicate that thermal treatment below 250 °C does not affect the carbon bonding contents in DLC thin film.
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Effect of thermal annealing on the structure of LiCoO2 powders prepared by co-precipitation method
(2021-12-01)
Khejonrak, Awadol
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Chanlek, Narong
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Sukkha, Usa
;
Triamnak, Narit
;
Chirawatkul, Prae
Lithium cobalt oxide (LiCoO<inf>2</inf>) powder was prepared by co-precipitation method and annealed at different temperatures of between 300 and 700 °C. The effect of annealing temperature and effect washing process with deionized water on the crystal structures of the prepared LiCoO<inf>2</inf> powders were thoroughly studied by Synchrotron powder X-Ray Diffraction (Syn-XRD), X-ray Absorption Spectroscopy (XAS), Dispersive Raman Microscopy (Raman) techniques. The change in chemical composition as a function of annealing temperature was also investigated by X-ray Photoelectron Spectroscopy (XPS) technique. The crystal structural results identified the phase evolution of the prepared LiCoO<inf>2</inf> powders upon heat treatment. The formation of HT-LiCoO<inf>2</inf> phase was observed at annealing temperature as low as 300 °C.
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Thermally induced phase transition and dielectric relaxation in lead-free BaTi0.94Sn0.06O3 Ceramics: Insights from in-situ XRD and XAS
(2025-11-01)
Sukkha, Usa
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Chanlek, Narong
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Kidkhunthod, Pinit
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Kolodiazhnyi, Taras
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Vittayakorn, Wanwilai
Lead-free BaTi<inf>0.94</inf>Sn<inf>0.06</inf>O<inf>3</inf> (BTS) ceramics were synthesized using the conventional solid-state reaction method to investigate thermally induced phase transitions and dielectric relaxation phenomena. A combination of in-situ X-ray Diffraction (XRD) and in-situ Synchrotron X-ray Absorption Spectroscopy (XAS) was employed to examine phase transitions across the temperature range of 200–400 K. The results reveal sequential phase transitions: rhombohedral-orthorhombic (R + O) at 200 K, orthorhombic (O) at 250–300 K, tetragonal (T) at 325–359 K, and tetragonal-cubic (T + C) at 373–400 K. Dielectric measurements highlight an anomalous relaxation behavior at 70–160 K, attributed to domain wall freezing. This phenomenon follows Vogel-Fulcher behavior, with an activation energy of 14 meV, a freezing temperature of 82 K, and an attempt frequency of 4.7 × 106 Hz. X-ray Photoelectron Spectroscopy (XPS) analysis reveals oxygen deficiency on the surface of the BTS ceramic, resulting in the coexistence of Ti3+/Ti4+ and Sn2+/Sn4+ oxidation states. These defects significantly influence the dielectric and phase transition properties. This study provides comprehensive insights into the interplay between local structural changes and phase transition mechanisms in BTS ceramics. By employing a multi-technique approach, it advances the understanding of dielectric and ferroelectric behaviors, positioning BTS ceramics as promising candidates for lead-free dielectric and ferroelectric device applications.

Sukkha, Usa

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