Repository logo
Communities & Collections
Research Outputs
Fundings & Projects
People
Statistics
New user? Click here to register.Have you forgotten your password?
  1. Home
  2. KMITL
  3. Publication
  4. Estimation of the organic film thickness on stainless steel using image intensity
Loading...
Thumbnail Image

Estimation of the organic film thickness on stainless steel using image intensity

Author(s)
Songthai, Maethinee
Suesut, Taweepol
Nunak, Navaphattra
Date Issued
August 14, 2018
Type
Conference Paper
DOI
10.1051/matecconf/201819203015
Abstract
This research proposes an estimation of thickness of organic film coating on a Stainless Steel surface (SS) and a clear microscope slide using a visible optical method with the image intensity level analysis. Sweetened Condensed Milk (SCM) was used as a representative of the organic film. The uncertainty of inverse calibration equations was evaluated to determine the reliability of this technique. The results showed that the image intensity increased with the increasing of the film thickness in a linear relationship with a high coefficient of determination (R2 > 0.97). Uncertainty of both inverse calibration equations was low and acceptable. It could be concluded that this technique could be used to estimate the thickness of the organic translucent film coating directly on a SS or a clear slide with the limitation of approximately 1.0 mm thickness using the reported linear inverse calibration equations.
Citation
Matec Web of Conferences, 192, 2018
Metrics
Get Involved!
  • Source Code
  • Documentation
  • Slack Channel
Make it your own

DSpace-CRIS can be extensively configured to meet your needs. Decide which information need to be collected and available with fine-grained security. Start updating the theme to match your Institution's web identity.

Need professional help?

The original creators of DSpace-CRIS at 4Science can take your project to the next level, get in touch!

Built with DSpace-CRIS software - Extension maintained and optimized by 4Science

  • Accessibility settings
  • Privacy policy
  • End User Agreement
  • Send Feedback