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    Analysis of effects of surface roughness on sensing performance of surface plasmon resonance detection for refractive index sensing application
    (2021-09-01) ;
    Shinnakerdchoke, Siratchakrit
    ;
    Pechprasarn, Suejit
    This paper provides a theoretical framework to analyze and quantify roughness effects on sensing performance parameters of surface plasmon resonance measurements. Rigorous coupled-wave analysis and the Monte Carlo method were applied to compute plasmonic reflectance spectra for different surface roughness profiles. The rough surfaces were generated using the low pass frequency filtering method. Different coating and surface treatments and their reported root‐mean-square roughness in the literature were extracted and investigated in this study to calculate the refractive index sensing performance parameters, including sensitivity, full width at half maximum, plasmonic dip intensity, plasmonic dip position, and figure of merit. Here, we propose a figure‐of-merit equation considering optical intensity contrast and signal‐to‐noise ratio. The proposed figure-of‐merit equation could predict a similar refractive index sensing performance compared to experimental results reported in the literature. The surface roughness height strongly affected all the performance parameters, resulting in a degraded figure of merit for surface plasmon resonance measurement.
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    Performance analysis of non‐interferometry based surface plasmon resonance microscopes
    (2021-08-01)
    Tontarawongsa, Sorawit
    ;
    ;
    Pechprasarn, Suejit
    Surface plasmon microscopy has been of interest to the science and engineering commu-nity and has been utilized in broad aspects of applications and studies, including biochemical sensing and biomolecular binding kinetics. The benefits of surface plasmon microscopy include label‐free detec-tion, high sensitivity, and quantitative measurements. Here, a theoretical framework to analyze and com-pare several non‐interferometric surface plasmon microscopes is proposed. The scope of the study is to (1) identify the strengths and weaknesses in each surface plasmon microscopes reported in the literature; (2) quantify their performance in terms of spatial imaging resolution, imaging contrast, sensitivity, and measurement accuracy for quantitative and non‐quantitative imaging modes of the microscopes. Six types of non‐interferometric microscopes were included in this study: annulus aperture scanning, half annulus aperture scanning, single‐point scanning, double‐point scanning, single‐point scanning, at 45 degrees azimuthal angle, and double‐point scanning at 45 degrees azimuthal angle. For non‐quantitative imaging, there is a substantial tradeoff between the image contrast and the spatial resolution. For the quantitative imaging, the half annulus aperture provided the highest sensitivity of 127.058 rad/μm<sup>2</sup> RIU<sup>−1</sup>, followed by the full annulus aperture of 126.318 rad/μm<sup>2</sup> RIU<sup>−1</sup>. There is a clear tradeoff between spatial resolution and sensitivity. The annulus aperture and half annulus aperture had an optimal resolution, sensitivity, and crosstalk compared to the other non‐interferometric surface plasmon resonance micro-scopes. The resolution depends strongly on the propagation length of the surface plasmons rather than the numerical aperture of the objective lens. For imaging and sensing purposes, the recommended mi-crofluidic channel size and protein stamping size for surface plasmon resonance experiments is at least 25 μm for accurate plasmonic measurements.
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    Silver thin film and water dielectric SPR sensor experimental and simulation characteristics
    (2019-01-01) ;
    Chittayasothorn, Suphamit
    This research project is the study of the Surface Plasmon Resonance (SPR) at the interface between silver thin film and the water dielectric layer. The purpose is to find the suitable thickness of the silver thin film layer which produces SPR and is suitable for SPR sensor applications. Both physical experiments and simulations are conducted using the Kretschmann Configuration. In the physical experiments, BK7 prisms are coated with silver thin films with the thickness of 60 nm, 80 nm, and 100 nm. The light source is p-polarized He-Ne Laser with the wavelength of 632.8 nm. Hawkeye laser detectors are used to detect the laser light intensity of reflected light for each desired angle. In the simulations, results of SPR signals are analyzed using the finite element method. The simulated results are found to agree with the results from the physical experiments.
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    Optical absorptivity enhancement of SiO2 thin film by Ti and Ag additive
    (2013-01-01)
    Junlabhut, Prasopporn
    ;
    Boonruang, Sakoolkarn
    ;
    This paper presents the visible optical absorptivity enhancement of SiO<inf>2</inf> thin films by Ti and Ag additive. SiO<inf>2</inf> thin films were prepared on glass substrate by sol-gel technique. Methacryloxy propyl trimethoxysilane (MAPTMS), Titanium isopropoxide (TiP) and Silver nitrate were used as precursors. MAPTMS was dissolved in absolute ethanol with various Ti and Ag content. The physical properties of as-prepared films were characterized by X-ray diffraction (XRD) and Transmission electron micrograph (TEM). The effects of Ti and Ag addition on optical properties were investigated from its optical absorption measured by UV-VIS Spectrophotometer (UV-VIS). XRD patterns shows the formation of TiO<inf>2</inf> and Ag in thin film. The effect of Ti and Ag additive on SiO<inf>2</inf> thin films were scrutinized by mean of the optical absorption in visible region. XRD and TEM results disclose the existence of TiO<inf>2</inf> and Ag nanoparticles in the as-prepared films. It can be observed that the improvement in optical absorption in both UV and visible region can be efficiently accomplished by the incorporation of Ti and Ag into SiO<inf>2</inf> films. © 2013 The Authors.