Nukeaw, Jiti

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Nukeaw, Jiti
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Nukeaw, J.
Nukeaw, Jitti
Nukeaw, Jiji
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jiti.nu@kmitl.ac.th

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    The innovative AlN-ISFET based pH sensor
    (2008-10-06)
    Bunjongpru, W.
    ;
    Porntheeraphat, S.
    ;
    Trithaveesak, O.
    ;
    Somwang, N.
    ;
    Khomdet, P.
    This innovative pH-ISFET sensor used nanocrystalline-AlN thin film as ion-sensitive membrane which prepared by reactive gas-timing r.f, magnetron sputtering without heating substrate and post annealing. The technique of gas-timing r.f. magnetron sputtering purposed by us, the feeding gas is on-off controlled periodically in such a way that the deposited AlOxNy film has a quite stable composition of aluminum, nitrogen and oxygen (A1:O:N=52:18:30 %) all over the entire film. The AlN-ISFET devices were structured. The pH-sensitivity characteristics show increasing sensitivity depended on film thickness. The highest sensitivity is 54.50 mV/pH achieved from 80 nm of AlN thin film which is comparable to our previous report Si<inf>3</inf>N<inf>4</inf>-ISFET devices. © 2008 IEEE.
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    Properties of CuPc/Se organics-inorganic hybrid thin films growth by electron beam evaporation technique
    (2007-12-01)
    Tunhoo, Benchapol
    ;
    Thiwawong, Thutiyaporn
    ;
    Nukeaw, Jiti
    Organic and Inorganic materials with copper (II) phthalocyanine (CuPc) and selenium (Se) were deposited to implement hybrid thin Alms by multi pocket electron beam evaporation technique. Crystallization of hybrid films was performed by x-ray diffraction (XRD) spectroscopy. XRD pattern exhibits monoclinic α-phase crystallizations structure of CuPc. Influences of the CuPc thickness on the crystalline structure of selenium films were obtained. As the thickness of CuPc layer was increased to 100 nm, the hexagonal Se was observed. Optical absorption spectra were measured by UV-Visible spectrophotometer. Results of hybrid absorption spectra were revealed to absorption spectra of CuPc and Se. Surface roughness of films can confirm with XRD spectra .The surface morphology was characterized by atomic force microscope (AFM) with non-contact mode, it illustrate the point that hybrid thin films is nanocrystal structure. © 2007 IEEE.
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    Organic vaporensors based on single-walled CNTs
    (2006-12-01)
    Chaisitsak, Sutichai
    ;
    Chaithongrat, Buaworn
    ;
    Nukeaw, Jiji
    ;
    Tuantranont, Adisorn
    An investigation of the influence of organic vapor (ethanol, methanol and acetone) on the characteristics of simple-structure sensors fabricated from single-walled carbon nanotube (SWCNT) thin films is reported. SWCNTs were directly deposited, by using atmospheric pressure CVD using alcohol-ferrocene mist, on the patterned Al electrodes to fabricate a sensor. It was found that the characteristic of SWCNT-based sensors depended on the depositing position in CVD reactor. The sensor response could be optimized by adjusting the depositing position along the inner quartz reactor. The sensor reproducibility could be improved by light soaking after switching to air. © 2006 IEEE.
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    UV-enhanced photodetector with nanocrystalline-TiO 2 thin film via CMOS compatible process
    (2011-12-01)
    Bunjongpru, W.
    ;
    Panprom, P.
    ;
    Porntheeraphat, S.
    ;
    Meananeatra, R.
    ;
    Jeamsaksiri, W.
    This research presents nanocrystal titaniumdioxide (nanocrystal-TiO <inf>2</inf>) film deposition technique with CMOS compatible process [1] to extend the optical response bandwidth of silicon based photodetecting devices toward ultraviolet range [2]. The thin films were initially deposited as Titanium Nitride (TiN) using DC magnetron reactive sputtering system. It was then annealed under nitrogen atmosphere at 800°C. After analyzing crystal structures and surface morphology with X-ray diffraction and FE-SEM systems, it was found that the deposited thin films showed the crystal phase of TiO <inf>2</inf> oriented along (200) plane of Rutile crystal structure with 50 nm grain size and increasing with film thickness. Using electroreflectance (ER) spectroscopy measurement [3], the bandgap of nanocrystal-TiO <inf>2</inf> was revealed to be 3.16 eV. PN-heterojunction photodiodes were fabricated with Nanocrystal-TiO <inf>2</inf>/SiO <inf>2</inf>/p-Si structures. Interdigitated aluminum structures were used as electrodes. By varying the thickness of nanocrystal-TiO <inf>2</inf> film, i.e. 30, 60, and 90 nm, the devices could response further into the UV range. The absorption edge wavelength investigated by photoresponse measurement was at 275 nm and shifting to the shorter wavelength as a function of the nanocrystal-TiO <inf>2</inf> grain size due to quantum confinement phenomenon [4]. The nanocrystal-TiO <inf>2</inf>/SiO <inf>2</inf>/p-Si photodetector had dark current = 5.31nA (2V), photocurrent = 0.9 uA, rise time = 58 us, fall time = 47 us at 30 nm thickness of TiO <inf>2</inf>. © 2011 IEEE.
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    High sensitive nanocrystal titanium nitride EG-FET pH sensor
    (2013-10-29)
    Rayanasukha, Yossawat
    ;
    Porntheeraphat, Supanit
    ;
    Bunjongpru, Win
    ;
    Khemasiri, Narathon
    ;
    Pankiew, Apirak
    Solid state pH-sensor device with high efficiency has successfully prepared by using TiN thin film as sensing membrane of extended gate field effect transistor (EG-FET) device. This research has described the physical properties and sensing characteristics of TiN membrane thin film which deposited on SiO<inf>2</inf>/Si substrate through reactive D.C. magnetron sputtering system. Thenanocrytal-TiNwith anatasestructure depended on substrate heating conditions was revealed from glancing angle x-ray diffraction. The I<inf>DS</inf>-V<inf>GS</inf> measurement in the standard buffer solutions showed that the sensitivity of fabricated TiN-EGFET pH deviceis 59.82mV/pH. © (2013) Trans Tech Publications, Switzerland.
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    Optical properties and structure of copper (II) phthalocyanine(CuPc) organic thin film grown by electron - Beam evaporation technique
    (2007-08-28)
    Tunhoo, Benchapol
    ;
    Nukeaw, Jiti
    Copper (II) Phthalocyanine (CuPc) thin films were grown by electron beam evaporation technique with various substrate temperatures. Crystalline of CuPc thin films was investigated by x-ray diffraction (XRD) spectroscopy. Diffraction pattern exhibit high quality crystalline films as monoclinic α-phase structure. Surface morphology of CuPc thin films was characterized by field emission electron microscope (FE-SEM) and the films grown with 150 °C substrate temperature illustrated nanorod-like structure. Absorption spectra were obtained by UV/Visible spectroscopy, revealed to Q-band and B-band. The transition energy of CuPc was characterized by photoreflectance spectroscopy (PR) correspond to an absorption peak of Q-band. © 2007 IEEE.
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    Highly-sensitive optofluidics-based single-flow-channel refractometer structure
    (2011-12-01)
    Chaitavon, Kosom
    ;
    Sumriddetchkajorn, Sarun
    ;
    Nukeaw, Jiti
    This paper shows how only a single-channel microfluidic chip when deployed in our interferometric optofluidics-based refractometer can offer a very high sensitivity of 6.1610 <sup>6</sup> RIU/pixel suitable for sensitive bio and chemical sensing applications. © 2011 IEEE.
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    Structural and optical properties of CuPc/ZnSe multilayer hybrid thin films prepared by electron beam evaporator
    (2007-12-01)
    Thiwawong, Thutiyaporn
    ;
    Tunhoo, Benchapol
    ;
    Nukeaw, Jiti
    Multilayer hybrid thin films consisting of alternating layers of organic and inorganic materials were fabricated with powder of copper-phthalocyanine (CuPc) and zinc selenide (ZnSe) by electron beam evaporator. The structural and optical characterization of multilayer hybrid thin film were carried out by using X-ray diffraction (XRD), atomic force microscope (AFM) and UV-Vis absorption spectroscopy. XRD patterns show two peaks of the orientation of (200) plane monoclinic structure in CuPc material and (111) plane cubic structure in ZnSe material where pair numbers of multilayer hybrid thin film higher than two pairs. With the variation in the number of pairs of CuPc/ZnSe, AFM images present almost similar morphology but the optical absorption spectra are significantly changed. Such spectral changes can be interpreted by the effect of the aggregate size and the characteristic of the multilayer hybrid structure. © 2007 IEEE.
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    The effects of substrate temperature on optical properties and surface morphology of nickel phthalocyanine thin films grown by organic evaporator system
    (2008-01-01)
    Inchidjuy, P.
    ;
    Pukird, S.
    ;
    Nukeaw, J.
    Thin films of Nickel Phthalocyanine (NiPc) are prepared at a base pressure of 10<sup>-6</sup> mbar using Organic Evaporator System. The films are deposited onto the glass substrate at various temperatures of 100 °C, 120 °C, 140 °C and 160 °C. Crystalline of NiPc thin films was investigated by X-ray diffraction (XRD) spectroscopy. XRD patterns exhibit to become aggravated crystalline films as monoclinic structure. Surface morphology of NiPc thin films was characterized by field emission scanning electron microscope (FE-SEM). FE-SEM micrographs indicate that fiber-like morphology of NiPc is enhanced with increasing substrate temperature. The optical absorption spectra of these thin films are measured. Present studies reveal that the Q-band of NiPc thin films appears as the change of electron energy level. Absorption spectra obtained from UV-vis of deposited NiPc are declined as the substrate temperature is risen. © 2008 Trans Tech Publications, Switzerland.
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    Study on optical and electronic properties of Sn-doped ZnPc
    (2013-10-29)
    Rangkasikorn, Adirek
    ;
    Sributr, Chaloempol
    ;
    Rojanasuwan, Sunit
    ;
    Tammarugwattana, Narin
    ;
    Mano, Kitipong
    Sn doped ZnPc films were deposited on intrinsic Si and glass substrates by organic source thermal co-evaporation technique with different deposition rates. Optical properties and electronic structure were characterized by UV-Vis spectroscopy and X-ray photoelectron spectroscopy (XPS) respectively. The UV-Vis results showed that phase transition of ZnPc from α- phase to β-phase occurred when Sn:ZnPc deposition rate is 0.3:0.7 or higher. XPS results indicated that the outer s electron of Sn atom is transferred to the ZnPc. Broadening of the C 1s spectra is observed with the increasing of Sn deposition rate. This broadening corresponds to the change of molecular environment surrounding carbon atoms in the Sn-doped ZnPc films. © (2013) Trans Tech Publications, Switzerland.