Repository logo
Communities & Collections
Research Outputs
Fundings & Projects
People
Statistics
New user? Click here to register.Have you forgotten your password?
  1. Home
  2. KMITL
  3. Publication
  4. Electroreflectance and photocurrent measurement of ZnSe/Alq 3/TPD heterostructure on Si-substrate
Loading...
Thumbnail Image

Electroreflectance and photocurrent measurement of ZnSe/Alq 3/TPD heterostructure on Si-substrate

Author(s)
Pecharapa, W.
Keawprajak, A.
Kayunkid, N.
Rahong, S.
Yindeesuk, W.
Nukeaw, J.
Date Issued
November 20, 2005
Type
Article
DOI
10.1016/j.mseb.2005.07.022
Abstract
The optical transition energy in ZnSe/tris(8-hydroxyquinoline) aluminum (Alq3)/N,N′-bis(3-methylphenyl)-N,N′-diphenyl-benzidine (TPD) heterostructure were investigated by room-temperature electroreflectance (ER) and photocurrent (PC) measurements. PC signal showed wavelength response of the device in the range of 450-1100 nm. ER features due to optical transition energy of the single quantum well of this structure were observed. The transition energies were determined by fitting the ER spectra to the theoretical line-shape expression. The subband transition energy decreased with increasing well thickness. Under applied voltage, both ER signals show significant shift due to the quantum confined Stark effect. © 2005 Elsevier B.V. All rights reserved.
Citation
Materials Science and Engineering B, 123(2), 163-166, 2005
Subjects

Electroreflectance

Heterostructures

Organic substances

Photocurrent

Quantum well

Metrics
Get Involved!
  • Source Code
  • Documentation
  • Slack Channel
Make it your own

DSpace-CRIS can be extensively configured to meet your needs. Decide which information need to be collected and available with fine-grained security. Start updating the theme to match your Institution's web identity.

Need professional help?

The original creators of DSpace-CRIS at 4Science can take your project to the next level, get in touch!

Built with DSpace-CRIS software - Extension maintained and optimized by 4Science

  • Accessibility settings
  • Privacy policy
  • End User Agreement
  • Send Feedback