Tunhoo, Benchapol
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Tunhoo, Benchapol
Alternative Name
Tunhoo, B.
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benchapol.tu@kmitl.ac.th
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Item type:Publication, Properties of CuPc/Se organics-inorganic hybrid thin films growth by electron beam evaporation technique(2007-12-01); ; Organic and Inorganic materials with copper (II) phthalocyanine (CuPc) and selenium (Se) were deposited to implement hybrid thin Alms by multi pocket electron beam evaporation technique. Crystallization of hybrid films was performed by x-ray diffraction (XRD) spectroscopy. XRD pattern exhibits monoclinic α-phase crystallizations structure of CuPc. Influences of the CuPc thickness on the crystalline structure of selenium films were obtained. As the thickness of CuPc layer was increased to 100 nm, the hexagonal Se was observed. Optical absorption spectra were measured by UV-Visible spectrophotometer. Results of hybrid absorption spectra were revealed to absorption spectra of CuPc and Se. Surface roughness of films can confirm with XRD spectra .The surface morphology was characterized by atomic force microscope (AFM) with non-contact mode, it illustrate the point that hybrid thin films is nanocrystal structure. © 2007 IEEE. - Some of the metrics are blocked by yourconsent settings
Item type:Publication, Optical properties and structure of copper (II) phthalocyanine(CuPc) organic thin film grown by electron - Beam evaporation technique(2007-08-28); Copper (II) Phthalocyanine (CuPc) thin films were grown by electron beam evaporation technique with various substrate temperatures. Crystalline of CuPc thin films was investigated by x-ray diffraction (XRD) spectroscopy. Diffraction pattern exhibit high quality crystalline films as monoclinic α-phase structure. Surface morphology of CuPc thin films was characterized by field emission electron microscope (FE-SEM) and the films grown with 150 °C substrate temperature illustrated nanorod-like structure. Absorption spectra were obtained by UV/Visible spectroscopy, revealed to Q-band and B-band. The transition energy of CuPc was characterized by photoreflectance spectroscopy (PR) correspond to an absorption peak of Q-band. © 2007 IEEE. - Some of the metrics are blocked by yourconsent settings
Item type:Publication, Structural and optical properties of CuPc/ZnSe multilayer hybrid thin films prepared by electron beam evaporator(2007-12-01); ; Multilayer hybrid thin films consisting of alternating layers of organic and inorganic materials were fabricated with powder of copper-phthalocyanine (CuPc) and zinc selenide (ZnSe) by electron beam evaporator. The structural and optical characterization of multilayer hybrid thin film were carried out by using X-ray diffraction (XRD), atomic force microscope (AFM) and UV-Vis absorption spectroscopy. XRD patterns show two peaks of the orientation of (200) plane monoclinic structure in CuPc material and (111) plane cubic structure in ZnSe material where pair numbers of multilayer hybrid thin film higher than two pairs. With the variation in the number of pairs of CuPc/ZnSe, AFM images present almost similar morphology but the optical absorption spectra are significantly changed. Such spectral changes can be interpreted by the effect of the aggregate size and the characteristic of the multilayer hybrid structure. © 2007 IEEE. - Some of the metrics are blocked by yourconsent settings
Item type:Publication, The effect of substrate temperature on structure and optical properties of copper (II) phthalocyanine (CuPc) thin films prepared by organic evaporation(2007-08-28); ; ;Sumriddetchkajorn, SarunThe influence of substrate temperature controls on Copper (II) phthalocyanine (CuPc) organic thin films onto glass substrate by organic evaporation system has been examined by X-ray diffraction (XRD), field emission scanning electron microscope (FE-SEM) and UV-VIS spectrophotometer. The two control methods are an on-off switching temperature control and a phase temperature control. The various substrate temperatures were controlled at 27, 80, 100, 120 and 150 °C, respectively. The thickness of all thin films is 30 nm. The XRD results from both methods show strongly peaks in orientation of [200] plane as α-phase monoclinic structure. By an on-off switching controlled temperature, the intensity of XRD peaks is increased with increasing substrate temperature. While intensity of XRD results from a phase controlled temperature shows increasing from 27 to 100 °C but decreasing from 120 to 150 °C. The CuPc grown at 150 °C exhibits nanorod-like structure obtained from an on-off switching temperature control and fiber-like structures obtained from a phase temperature controls. The optical absorptions of CuPc thin films of both methods determined from UV-VIS spectrophotometer show two strong peaks at 330 nm and 620 nm, denoted the B-band and Q-band, respectively. © 2007 IEEE. - Some of the metrics are blocked by yourconsent settings
Item type:Publication, Structural and optical properties of low temperature evaporated iron phthalocyanine thin films(2009-09-01); Metallophthalocyanines are the key functional materials for organic semiconductor devices. In this paper, the authors report the influence of substrate temperature on properties of iron phthalocyanine (FePc) thin films. Iron phthalocyanine films were prepared by low temperature evaporation technique at different temperatures of the glass substrate. Structural parameters such as the crystalline size of FePc films, dislocation density and the lattice microstain can be calculated from XRD spectra. Phase transformation of the a-b phases of FePc thin films due to different substrate temperatures was observed. Optical absorption spectra of FePc films show absorption bands which correspond to the B-band and the Q-band. In the case of FePc film prepared at room temperature, the surface morphology shows small crystal grains. At higher substrate temperatures, the film morphology gradually changes from fine grain to rod-like structure. © W. S. Maney & Son Ltd. 2009. - Some of the metrics are blocked by yourconsent settings
Item type:Publication, Observation of optical transition energy in ZnSe/tris(8-hydroxyquinoline) aluminum (Alq3)/ZnSe single quantum wells by photoreflectance spectroscopy(2004-03-01); ;Upprakhot, K.; ; The optical transition energy in ZnSe/tris(8-hydroxyquinoline) aluminum (Alq3)/ZnSe single quantum wells (SQW) thin films with well thickness from 5 to 50 nm was investigated by room-temperature photoreflectance (PR) measurements. PR features due to optical transition energy were observed in the SQWs of well thicknesses. The transition energies were determined by fitting the PR spectra to the theoretical line-shape expression. The transition energy decreased with increasing well thickness. © 2003 Elsevier B.V. All rights reserved.
